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dc.contributor.authorShcherba, Ivan D.pl
dc.contributor.authorUskokovic, Dragonpl
dc.contributor.authorAntonov, Victor M.pl
dc.contributor.authorKotur, Bogdan Ja.pl
dc.contributor.authorSacharevych, Mariapl
dc.contributor.authorStosyk, Andrypl
dc.contributor.authorJatcyk, Bogdan M.pl
dc.date.accessioned2024-02-19T11:45:31Z
dc.date.available2024-02-19T11:45:31Z
dc.date.issued2013
dc.identifier.citationAnnales Universitatis Paedagogicae Cracoviensis. 120, Studia Technica 6 (2013), s. [117]-124pl
dc.identifier.urihttp://hdl.handle.net/11716/12867
dc.description.abstractFor the first time, for a compound with the $HfFe_2S_2$ structure it is established on the basis of X-ray emission spectroscopy the structure of valence band. Band structure and theoretical spectra of X-ray emission bands of atoms located in non-equivalent crystallographic positions are calculated by the LMTO method in non-relativistic approximation. A satisfactory agreement between theoretical and experimental data is achieved.en
dc.languageenpl
dc.language.isoenpl
dc.subjectX-ray spectraen
dc.subjectelectron structureen
dc.subjectvalence banden
dc.titleElectron structure of $ScFe_2Si_2$ compound: theory and experimentpl
dc.title.alternativeElectron structure of $ScFe_2Si_2$ compound: theory and experimenten
dc.typeArticlepl


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